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During a group meeting, the experimentalists discussed adding a method for calculating the tip broadening of an AFM image. This would be very useful.
The proposed method would be to:
This would need to be done after the ordered tracing stage, possibly after the splining stage?
None so far
No response
The text was updated successfully, but these errors were encountered:
Is this related to (or a duplicate of) #108 ?
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Is your feature request related to a problem?
During a group meeting, the experimentalists discussed adding a method for calculating the tip broadening of an AFM image. This would be very useful.
Describe the solution you would like.
The proposed method would be to:
This would need to be done after the ordered tracing stage, possibly after the splining stage?
Describe the alternatives you have considered.
None so far
Additional context
No response
The text was updated successfully, but these errors were encountered: