HT-tools: a comprehensive suite of automated tools for high-throughput characterization of thin-film materials libraries.

What is HT-tools?

HT tools is an automated data-analysis and visualization open source software for Windows and MacOS that enables analyze your experimental materials library data with high-quality and increased productivity. It has easy to use interface, live-time graphical display, and simultaneous review mode. This software implements automated high-quality high-throughput characterization algorithms to determine the compositional, structural and (multi)functional properties of materials contained in the libraries.

Tools that are included in this project:

1. EDX measurement related tools

• EDX composition: view and analysis EDX data. The data could be a complete materials library containing 342 measurement points or a strip or a chip.
• Adjust materials libraries composition: predict and find the desired element content ratio for sputtering experiment. The tool supports any number of cathodes.
• Wafer (materials libraries) comparison: compare how similar are two libraries in the given deviations.

2. Thickness tools

• Thickness: determine and calculate thickness data obtained from profilometer (Ambios)

3. XRD related tools

• 2D to 1D convert: automated convert XRD frames (Bruker D8 Discover) into any kind of supported format.
• Baseline subtraction: subtract baseline for XRD data.
• Phase identification: XRD data analysis and phase determination based on comparison of data with ICSD database.
• Reference (.cif) rename: rename and reformat XRD data.

4. Band gap and resistance related tools

• Band gap determination: automated calculate band gap.
• Room-temperature resistance: visualize resistance data.
• Temperature-dependent resistance: analysis and view of multiple reisitance data.

5. Electrocatalytic related tools

• SDC analysis: fast view heatmap for a library data
• SECCM tool: define the overlapping of XRD and electrocatalytic data.

6. Other tools

• Sputter concentration: get a first impression of sputtering results
• Wafer photo RGB: view and extract wafer image from photos

News

💥 [2022-01-03] HT-tools now supports visualization of multi-dimensional compositions in 3D polyhedron.
💥 [2021-12-22] HT-tools adds SECCM data analytic software.
💥 [2021-05-20] HT-tools adds band gap determination software.
💥 [2029-12-04] HT-tools adds phase identification software.
💥 [2019-11-14] HT-tools v0.1.0 is released!

Features

Example of visualization the coordinated tool chain for high-throughput data analysis. Multiple diffraction data files are imported to a preprocessing tool. Background subtraction, phase identification, element composition visualization are automated performed and the results are saved in database.

List of key features

✅ Automate routine tasks for quick and easy analysis
✅ Mouse click to acquire and report data
✅ Display configuration options for reporting according journal's requirement
✅ Dynamically view for the most accurate and efficient analysis
✅ Flexibility to search, select, and combine data
✅ Easily compare data from multiple samples in the same report
✅ Save and recall data processing procedures to automate data analysis and visualization
✅ Simultaneously perform analysis during data processing

Python dependencies

The list of required python packages is contained in the requirements.txt file in this repository.

Install the requirements from PyPI using pip. ::

$ python3 -m pip install -r requirements.txt

Feedback

Please provide feedback on how to improve HT-tools, or if you request additional distributions to be implemented, by opening a new issue.